x Ga

Impact Ionization Coefficients in (AlxGa1-x)0.52In0.48P and AlxGa1-xAs Lattice-Matched to GaAs

IEEE Transactions on Electron Devices(2021)

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摘要
The impact ionization characteristics of (Al x Ga 1-x ) 0.52 In 0.48 P have been studied comprehensively across the full composition range. Electron and hole impact ionization coefficients ( α and β, respectively) have been extracted from avalanche multiplication and excess noise data for seven different compositions and compared to those of Al x Ga 1-x As. While both α and β initially decrease gradually with increasing bandgap, a sharp decrease in β occurs in (Al x Ga 1-x ) 0.52 In 0.48 P when x > 0.61, while α decreases only slightly. α and β decrease minimally with further increases in x and the breakdown voltage saturates. This behavior is broadly similar to that seen in Al x Ga 1-x As, suggesting that it may be related to the details of the conduction band structure as it becomes increasingly indirect in both alloy systems.
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AlGaAs,AlGaInP,avalanche breakdown,avalanche photodiodes (APDs),excess noise,GaAs,impact ionization
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