Multi-Spectrum Analysis Of Growth Temperature Dependent Crystal Structure Of Mgzno Thin Films Grown On Sapphire
2017 ASIA COMMUNICATIONS AND PHOTONICS CONFERENCE (ACP)(2017)
摘要
Mg0.06Zn0.94O films are epitaxially grown at 350 to 650 degrees C. Depolarization effect was found occurs at similar to 390 nm, while the thickness non-uniformity increases with growth temperature, ascribed to increased Mg incorporation into hexagonal ZnO phase.
更多查看译文
关键词
multispectrum analysis,growth temperature dependent crystal structure,depolarization effect,thin films,temperature 350 degC to 650 degC,MgZnO
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要