Multi-Spectrum Analysis Of Growth Temperature Dependent Crystal Structure Of Mgzno Thin Films Grown On Sapphire

2017 ASIA COMMUNICATIONS AND PHOTONICS CONFERENCE (ACP)(2017)

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摘要
Mg0.06Zn0.94O films are epitaxially grown at 350 to 650 degrees C. Depolarization effect was found occurs at similar to 390 nm, while the thickness non-uniformity increases with growth temperature, ascribed to increased Mg incorporation into hexagonal ZnO phase.
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关键词
multispectrum analysis,growth temperature dependent crystal structure,depolarization effect,thin films,temperature 350 degC to 650 degC,MgZnO
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