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A Design Of Boundary Scan Test Controller For Digital Circuits

Xu Lei,Chen Shengjian, Wang Yu,Wang Jinyang

ISTM/2009: 8TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-6（2009）

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Abstract
A design of boundary scan test controller for digital circuits is presented in the paper The design absolutely fulfills the requirements of the boundary scan standard IEEE1149.1, and is chiefly composed of an AVR and a test bus controller chip named SN74ACT8990. Based on the boundary scan test theories, the controller makes the fault diagnosis of digital circuits more efficient and less expensive. The functions are verified by a test experiment.
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Key words
boundary scan, test controller, digital circuits, fault diagnose
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