Research on NFS Test Method of An Embedded CPU

With the development of the CPU industry, the electromagnetic compatibility (EMC) of CPU and its testing methods are receiving more and more attention from electronics, electrical engineers and engineering technicians. In order to meet the requirements of electromagnetic compatibility standard testing and to ensure the stability and reliability of the CPU, the designer must perform complete electromagnetic compatibility testing and design of the product. In this paper, the CPU chip is tested in the near field scan (NFS) according to the IEC61967-3 standard. Compared with the traditional test, the surface scanner is used for testing. This paper analyzes the test method, analyzes the test results in detail, lays a foundation for in-depth study of the electromagnetic compatibility of the CPU, and provides a basis and reference for the domestic IC EMC standard formulation. In addition, this paper also puts forward some considerations in the actual testing process of the surface scan method.