Electromagnetic Transmission Characteristics of Multi-Scale Fractal Meander-Shaped Interconnect Structures for Flexible Chip Applications

In order to ascertain high-frequency transmission properties of multi-scale meander-shaped interconnect structures for flexible chip applications, electromagnetic characteristics of flexible interconnect structures with different line widths and line lengths are analyzed. Fractal right angle U-shape coplanar waveguide (CPW) is adopted in these interconnect structures. Multi-scale flexible interconnect structures are simulated, and influence of line width and line length are analyzed. Flat and bending states of the interconnect structures with different line lengths are measured. Simulation and measured results show that the increase of line length can enlarge the insertion loss over the whole range of 0.01-40GHz, while line width mainly affects the insertion loss in the lower frequency band of 0.01-8GHz and the higher frequency band of 34-40GHz, and in the range of 0.01-8GHz power loss tends to decrease with width increases, yet in the frequency range of 34-40GHz, the increase of line width leads to a higher power loss.