Layer-Number Dependent Reflection Spectra Of Ws2 And Wse2 Flakes On Sio2/Si Substrate

Xiaoli Li,Xiaofen Qiao,Longlong Wang,Yafang Shi,Weifeng Zhang

2017 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY - OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS（2017）

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摘要

Tremendous interest has recently focused on the layered TMDs. Layer number is one of the fundamental parameters in TMDs. In this paper, layer-number dependent reflectivity of WS2 and WSe2 flakes on SiO2/Si substrate were measured by a simple and fast reflection spectrum probing technique. Characteristic excitonic peaks, A and B, and some higher energy density of states excitonic peaks were observed and their properties as a function of layer number were studied. Our results are in agreement with the previous reports.

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关键词

transition metal dichalcogenides (TMDs), WS2 and WSe2, reflection spectra, Layer-number, excitonic peaks

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