Layer-Number Dependent Reflection Spectra Of Ws2 And Wse2 Flakes On Sio2/Si Substrate
2017 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY - OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS(2017)
摘要
Tremendous interest has recently focused on the layered TMDs. Layer number is one of the fundamental parameters in TMDs. In this paper, layer-number dependent reflectivity of WS2 and WSe2 flakes on SiO2/Si substrate were measured by a simple and fast reflection spectrum probing technique. Characteristic excitonic peaks, A and B, and some higher energy density of states excitonic peaks were observed and their properties as a function of layer number were studied. Our results are in agreement with the previous reports.
更多查看译文
关键词
transition metal dichalcogenides (TMDs), WS2 and WSe2, reflection spectra, Layer-number, excitonic peaks
AI 理解论文
溯源树
样例
![](https://originalfileserver.aminer.cn/sys/aminer/pubs/mrt_preview.jpeg)
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要