Influence Of Interface On The Charge Carrier Mobility Of La2ti2o7 Layered Perovskite Thin Films Measured By The Time-Of-Flight Method

We report the electrical characterizations of La2Ti2O7 thin films synthetized by pulsed laser deposition. We observe a significant change in I-V curve in the presence of UV light. The conduction mechanism can be described by two regimes: ohmic at low voltage and space charge limited conduction for higher voltage. Finally, for the first time to our knowledge, the charge carrier mobility of this material is studied; we use the time-of-flight method to investigate this property. We explain the evolution of the carrier mobility with the applied voltage by the presence of a depletion layer between the film and the gold contact, which affects the measurements.