Quantitative analysis of trace elements of silver disturbed by pulse pile up based on energy dispersive X-ray fluorescence (EDXRF) technique

The detection of trace elements of silver in refined copper based on the portable energy dispersive X-ray fluorescence spectrometer was disturbed severely by pulse pile-up, so quantitative analysis had a high method detection limit and low accuracy. A new approach was provided to reduce the appearance of the pulse pile-up and lower the detection limit. A robust quantitative model was established. The coefficient of determination R2 of the model was lifted to 0.9927 from 0.9338; the detection limit was reduced to 0.0034 wt%. This model can be used in the metallurgical industry, power plants, and the study of micro-structure enhancement mechanisms.