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Rigorous Coupled Wave Analysis Of Gaas Thermophotovoltaic Devices With A Patterned Dielectric Back Contact

Madhan K. Arulanandam,Jeronimo Buencuerpo,Myles A. Steiner,Eric J. Tervo,Leah Y. Kuritzky,Emmett E. Perl,Brendan M. Kayes,Justin A. Briggs,Richard R. King

2021 IEEE 48TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)（2021）

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Abstract
In principle, a patterned dielectric back contact structure in a GaAs thermophotovoltaic device boosts the sub-bandgap reflectance. Rigorous coupled wave analysis method is used to study the three dimensional (3D) periodic grating effects of metal point contact diameter and spacing on sub-bandgap reflectance of the device.
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GaAs, thermophotovoltaics, efficiency, rigorous coupled wave analysis, patterned dielectric back contact, diffraction grating, sub-bandgap spectrum
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