In Situ Characterization Of Ceramic Cold Sintering By Small-Angle Scattering
JOURNAL OF THE AMERICAN CERAMIC SOCIETY(2021)
Abstract
The first in situ characterization of the pore morphology evolution during the cold sintering process (CSP) is presented using small-angle X-ray scattering methods. For practical reasons, measurements have been made on a model system, KH2PO4 (KDP). The scattering signal revealed a striking behavior that could be modeled with nanoscale structural features associated with the dissolution and reprecipitation of KDP close to the grain/pore interface during CSP. The prospects for future more quantitative experiments under a range of temperature and pressure conditions, as well as for studies of more technologically important materials such as ZnO are considered.
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Key words
characterization, cold sintering process, X-ray methods
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