Band tunable X-ray flat crystal spectrometer for laser-produced plasma spectroscopy measurements

An updated design of a band-tunable flat crystal spectrometer is presented. The new configuration contributes to a broad spectral coverage with greater resolving power, a strong rejection of hard X-ray backgrounds, and decreased sensitivity to source broadening for an extended source. To verify the performance of the spectrometer, spectral lines were measured using a potassium acid phthalate crystal for highly ionized species of aluminum or silicon, and the results were compared by measuring H- and He-like Al and Si lines by rotating the crystal to selected Bragg angles, at the Shenguang II laser facility. The observed energy-coverage range is consistent with the theoretical predictions, as well as with the measured spectral resolution of similar to 300.