Transient Current Effect On The Dye Sensitized Solar Cells I-V Characterization

A choosing process for the sampling delay in the dye sensitized solar cells I-V characterization method was established. The presented method is based on the stepwise varying bias voltage technique. The analyses were based on the solar cell transient current impact on the cell I-V acquisition. This process presents a method to correctly fix the I-V scan sampling delay concerning the cell settling time to obtain accurate dye sensitized solar cells performance measures. It allows a faster acquisition compared to classical measurement method to avoid the solar cell heating. All tests were performed on a typical TiO2 natural-dyed solar cell, dedicated to laboratory tests. The cell manufacturing process was also discussed. Measures were operated by a laboratory developed digital acquisition board. The system architecture, as well as its operating algorithm, was presented.