Schrodinger Simulation Of Hot-Electron Photodetection

2019 ASIA COMMUNICATIONS AND PHOTONICS CONFERENCE (ACP)（2019）

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摘要

The hot-electron (HE) dynamic process is investigated when HEs traversing metal-dielectric-metal junction. Schrodinger equation is employed to calculate the transmission possibility. It is shown that HE cavity is responsible for the enhanced transmission. (C) 2019 The Author(s)

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关键词

hot-electron photodetection,dynamic process,metal-dielectric-metal junction,Schrödinger equation,transmission possibility,HE cavity,enhanced transmission

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