Investigation Of Magnetoelectricity In La2nimno6 Thin Film Deposited By Pulsed Laser Deposition

Polycrystalline thin film of La2NiMnO6 (LNM) is deposited successfully on Pt/TiOx/SiO2/Si substrates using pulsed laser deposition technique. The X-ray diffraction data and the Raman spectra confirm the formation of a single phase with P2(1)/n space group and also the indication of Mn4+ obtains in X-ray photoelectron spectroscopyhints towards the formation of ordered double perovskites. Significant magnetoelectric voltage is observed in the temperature range of 138 to 400 K, which may be due to the huge strain present in the sample and the short range ordering (upto 400 K) of the sample. The resistivity vs. temperature measurement reveals the metallic behavior of the thin film.