Highly accurate wiring fabrication technologies by plasma dry processes for 3D-IC and fan-out packaging

2018 Pan Pacific Microelectronics Symposium (Pan Pacific)(2018)

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摘要
Smart ICT (Information and Communication Technology) such as “Big Data”, “Cloud computing” and Smart Functionalities such as Stand-alone Self-activating MEMS/Sensors construct Smart Systems which enable IoT (Internet of Things), IoE (Internet of Everything) thus Smart Society. To realize above-mentioned Smart Technologies, high-density, low-power consumption, wide-bandwidth, fast-operation semiconductor devices as well as smart functional devices enabled by integrating functionalities with advanced semiconductor technologies including CMOS technologies are necessary. High-density Packaging technologies such as 3D, 2.5D packaging scheme basing on TSV (through-Si via) technology and 2.1D PWB packaging are among key technologies to satisfy the requirements from the both smart semiconductor devices and smart functional devices. Meanwhile MEMS/Sensors are required as multi-functionalities of stand-alone smart devices for wearable devices including smart phone, an important part of Smart Systems. ULVAC has been continuously developing manufacturing solutions for Smart Technologies. In this talk, our high-density packaging technologies including scallop-free, low-temperature processed TSV solution for via-last packaging scheme and 2.1D packaging solutions on large panel build-up PWB will be introduced.
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TSV,Si-DRIE,Via-last,2.1D,PWB panel
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