Energy-Filtered Imaging On A 300kv Tem
ELECTRON MICROSCOPY AND ANALYSIS 1995(1995)
Abstract
Some applications of energy-filtered imaging with a Gatan Imaging Filter interfaced to a Philips CM30 TEM operated at 300 kV are described. Aluminum particles <2nm diameter in ion-implanted MgAl2O4 spinel have been detected by imaging with 15eV Al-plasmon-loss electrons. Grain boundary Cr depletion that occurs between Cr-rich M(23)C(6) particles in sensitized type 304L stainless steel has been measured from Cr core-loss images normalized by the low-loss signal and t/lambda to yield Cr atoms/unit volume. Partitioning of Ni between the gamma Ni solid solution matrix and large gamma' [Ni-3(Al,Ti)] particles in Rene 95 Ni-base superalloy has been measured from normalized Ni concentration images.
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