Radiation Test And Application Of Fpgas In The Atlas Level 1 Trigger

V Bocci,M Carletti, G Chiodi,E Gennari, E Petrolo,A Salamon, R Vari,S Veneziano

PROCEEDINGS OF THE SEVENTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS(2001)

引用 0|浏览0
暂无评分
摘要
The use of SRAM based FPGA can provide the benefits of re-programmability, in system programming, low cost and fast design cycle.The single events upset (SEU) in the configuration SRAM due to radiation, change the design's function obliging the use in LHC environment only in the restricted area with low hadrons rate.Since we expect in the Atlas muon barrel an integrated dose of 300 Rads and 5.65-10(9) hadrons/cm(2) in 10 years, it becomes possible to use these devices in the commercial version. SEU errors can be corrected online by reading-back the internal configurations and eventually by fast reprogramming.In the frame of the Atlas Level-1 muon trigger we measured for Xilinx Virtex devices and configuration FlashProm:The Total Ionizing (TI) dose to destroy the devices;Single Event Upset (SEU) cross section for logic and program cell;An upper limit for Latch-Up (LU) event.With the expected SEU rate calculated for our environment we found a solution to correct online the errors.
更多
查看译文
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要