Automated Optoelectronic System For Diagnostics Of Optical Variable Devices

Optically variable devices (OVD), otherwise called security holograms are widely used to protect IDs and other sensitive documents against counterfeiting. That being said, the problem of quick authenticity verification and quality control remain to be of utmost importance. This paper presents a prototype of the automated optical-electronic device for OVD authentication and quality control, as a complex solution. Developed device allows to conduct both quick preliminary hologram inspection, which is based on photometric image analysis, and in-depth hologram analysis. In-depth analysis implies microrelief parameters, like spatial frequency, relief depth, grating orientation measurements, using light intensity distribution in diffraction orders and the formed pattern of diffraction orders.