The Reliability Model For The Fpga-Based Instrument And Control System Using Colored Petri Net
PROCEEDINGS OF THE 25TH INTERNATIONAL CONFERENCE ON NUCLEAR ENGINEERING, 2017, VOL 1(2017)
摘要
As the FPGA based solution is the software design process but the product is hardware, it is feasible to licensing the FPGA based I&C system by the nuclear regulator. By noticing the advantages of the FPGA technology and gaining the experience in other industrial fields, it is exploited as the design solution in the NPP I&C system, mainly for the safety protection. systems. The paper proposes a reliability evaluation model by using the Colored Petri Net for an FPGA based I&C system wherein the fault coverage is considered. And the proposed models are the generic models for I&C system except that the parameters are not same. The models concern on the hardware modules without the logics (software failure) to control and protect the plant. The detection and recovery time influence for the system availability is evaluated in the model. Based on the proposed model, the Monte Carlo simulation is performed as it is the possible way for a complex system model with uncertainty. Consequently, the indicators such as MTTR, MTBF, PFD and so on are calculated. Three main conclusions are obtained from the calculated results i.e., (i) In order to increase the reliability of the FPGA based modules, it is recommended to consider the logic function to separate the FPGA chip to different groups to decrease the failure rate of the module; (ii) It is suggested to shorten the fault tolerance technique required time and to increase the online fault coverage to decrease the MTTR and minimize the failure probability of the system. (iii) The independent failure of the modules and the detection and the repair time delay only cause the two trains failure.
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关键词
FPGA, Colored Petri net, Fault tolerance and fault coverage, instrument and control (I&C)
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