Quantitative Evaluation Of Hard X-Ray Damage To Biological Samples Using Euv Ptychography
X-RAY MICROSCOPY CONFERENCE 2016 (XRM 2016)(2017)
Abstract
Coherent diffractive imaging (CDI) has become a standard method on a variety of synchrotron beam lines. The high brilliance short wavelength radiation from these sources can be used to reconstruct attenuation and relative phase of a sample with nanometre resolution via CDI methods. However, the interaction between the sample and high energy ionising radiation can cause degradation to sample structure. We demonstrate, using a laboratory based high harmonic generation (HHG) based extreme ultraviolet (EUV) source, imaging a sample of hippocampal neurons using the ptychography method. The significant increase in contrast of the sample in the EUV light allows identification of damage induced from exposure to 7.3 keV photons, without causing any damage to the sample itself.
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Key words
Coherent Diffractive Imaging,Ptychography,Phase Contrast Imaging,High-Resolution Imaging,Diffraction Microscopy
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