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Advances in Electron Channelling Contrast Imaging and Electron Backscatter Diffraction for Imaging and Analysis of Structural Defects in the Scanning Electron Microscope

C. Trager-Cowan,A. Alasmari, W. Avis,J. Bruckbauer,P. R. Edwards,B. Hourahine,S. Kraeusel,G. Kusch,B. M. Jablon, R. Johnston,R. W. Martin, R. Mcdermott,G. Naresh-Kumar,M. Nouf-Allehiani,E. Pascal,D. Thomson,S. Vespucci,K. Mingard,P. J. Parbrook,M. D. Smith,J. Enslin,F. Mehnke,M. Kneissl,C. Kuhn,T. Wernicke,A. Knauer,S. Hagedorn,S. Walde,M. Weyers,P-M Coulon,P. A. Shields,Y. Zhang,L. Jiu,Y. Gong,R. M. Smith,T. Wang,A. Winkelmann

IOP Conference Series Materials Science and Engineering（2020）

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