Collector dependence of field emission in the Scanning Field Emission Microscopy
2021 34th International Vacuum Nanoelectronics Conference (IVNC)(2021)
Abstract
We have performed density functional VASP calculations of a carbon covered tungsten surface under the presence of an electric field F directed away from the surface i.e., pushing the electrons into the surface. We have found that under the presence of this field the extrapolated to the surface straight line which represents the increase of the vacuum energy with distance cuts the energy axis on th...
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Key words
Microscopy,Elementary particle vacuum,Tungsten,Electric fields,Carbon,Nanoelectronics
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