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SEU effects induced by Reactor Spallation and Accelerator neutron sources in Nano-SRAMs

Junlin Li, Wei Chen, Wei Wu,Xiaoming Jin,Ruibin Li,Chao Qi,Minbo Liu,Yan Liu

2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED)（2021）

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Abstract
This paper presents the experimental research of neutron induced single event upset (SEU) in Nano-SRAMs which was carried out in CSNS (China Spallation Neutron Source), CIAE (China institute of atomic energy) and XAPR (Xi’an pulsed reactor). The SEU cross section of Nano-SRAMs with four different feature sizes were measured. Experimental results indicated that the neutron induced SEU cross section...
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Key words
neutron induced SEU,nano-SRAMs,SEU cross section,different neutron sources
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