Single Event Transients Generation and Propagation Flow using Commercial EDA Tools

The ever increasing demand for reliable microelectronic systems in the presence of radiation, combined with the continuous shrinking of CMOS technologies, has rendered the impact of radiation-induced voltage glitches, known as Single Event Transients (SETs), more and more critical. In order to mitigate such errors, the analysis of circuit radiation immunity to these effects is mandatory. This anal...