Intelligent Fault Analysis Decision Flow in Semiconductor Industry 4.0 Using Natural Language Processing with Deep Clustering
2021 IEEE 17th International Conference on Automation Science and Engineering (CASE)(2021)
摘要
Microelectronics production failure analysis is a time-consuming and complicated task involving successive steps of analysis of complex process chains. The analysis is triggered to find the root cause of a failure and its findings, recorded in a reporting system using natural language. Fault analysis, physical analysis, sample preparation and package construction analysis are arguably the most use...
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关键词
Deep learning,Electronics industry,Failure analysis,Clustering algorithms,Transforms,Production,Predictive models
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