Intelligent Fault Analysis Decision Flow in Semiconductor Industry 4.0 Using Natural Language Processing with Deep Clustering

2021 IEEE 17th International Conference on Automation Science and Engineering (CASE)(2021)

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摘要
Microelectronics production failure analysis is a time-consuming and complicated task involving successive steps of analysis of complex process chains. The analysis is triggered to find the root cause of a failure and its findings, recorded in a reporting system using natural language. Fault analysis, physical analysis, sample preparation and package construction analysis are arguably the most use...
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关键词
Deep learning,Electronics industry,Failure analysis,Clustering algorithms,Transforms,Production,Predictive models
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