Fault Injection of TMR Open Source RISC-V Processors Using Dynamic Partial Reconfiguration on SRAM-based FPGAs
2021 IEEE SPACE COMPUTING CONFERENCE (SCC)（2021）
关键词
RISC-V,Fault tolerance,redundancy,Triple Modular Redundancy (TMR),Single Event Upset (SEU),fault injection,radiation testing,FPGA,soft processor
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