Fault diagnosis of Gate Level 2 – to – 1 Multiplexer in FinFET Technology
2021 International Conference on System, Computation, Automation and Networking (ICSCAN)（2021）
摘要
This work deeply studies the identification of stuck at faults and its corresponding test vectors for a circuit. The circuit under consideration is a 2 – to – 1 multiplexer designed by NAND gate developed with the FinFET technology. The main constraint on design of the circuit is its area and power consumption. The design is simulated and its functionality is verified using Microwind 3.8. The simu...
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关键词
Multiplexing,Adaptation models,Power demand,Codes,Logic gates,Fault location,FinFETs
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