Bayesian analysis of Ag thin films formation
Micron（2021）
Abstract
•The topography of Ag thin film is studied by AFM for thickness ranged from 8 up to 50 nm.•The topographic images are analyzed by Bayesian statistic and a Markov Chain Monte Carlo method.•This statistical analysis allow describe correctly the height and grain distributions of the samples.
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Key words
Atomic Force Microscope,Image processing,Bayesian statistic,Markov Chain Monte Carlo
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