Comparison Investigations on Unclamped-Inductive-Switching Behaviors of Power GaN Switching Devices

IEEE Transactions on Industrial Electronics(2022)

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摘要
This article makes the comparisons on the behaviors of three types of commercial GaN power switching devices, including Schottky gate p-GaN high electron mobility transistor (HEMT), ohmic gate p-GaN HEMT with hybrid drain, and Cascode GaN device, under single-pulse and repetitive unclamp-inductive-switching (UIS) conditions by experiments and simulations. It shows that all the three types of GaN d...
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关键词
Logic gates,Capacitance,MODFETs,HEMTs,Stress,Inductors,Degradation
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