Comparison Investigations on Unclamped-Inductive-Switching Behaviors of Power GaN Switching Devices
IEEE Transactions on Industrial Electronics(2022)
摘要
This article makes the comparisons on the behaviors of three types of commercial GaN power switching devices, including Schottky gate p-GaN high electron mobility transistor (HEMT), ohmic gate p-GaN HEMT with hybrid drain, and Cascode GaN device, under single-pulse and repetitive unclamp-inductive-switching (UIS) conditions by experiments and simulations. It shows that all the three types of GaN d...
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关键词
Logic gates,Capacitance,MODFETs,HEMTs,Stress,Inductors,Degradation
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