Analytical solution of crystal diffraction intensity*

CHINESE PHYSICS B(2021)

Cited 0|Views18
No score
Abstract
Plasma density and temperature can be diagnosed by x-ray line emission measurement with crystal, and bent crystals such as von Hamos and Hall structures are proposed to improve the diffraction brightness. In this study, a straightforward solution for the focusing schemes of flat and bent crystals is provided. Simulations ith XOP code are performed to validate the analytical model, and good agreements are achieved. The von Hamos or multi-cone crystal can lead to several hundred times intensity enhancements for a 200 upmu mplasma source. This model benefits the applications of the bent crystals.
More
Translated text
Key words
crystal diffraction,analytic method,x-ray diffraction
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined