Model Parameter Extraction Tool for the Analysis of Series-Connected SiC-MOSFETs

Cedric Mathieu de Vienne,Besar Asllani,Bruno Lefebvre,Pierre Lefranc,Pierre-Olivier Jeannin

PCIM Europe digital days 2021; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management（2021）

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摘要

This paper presents a parameter identification tool for SiC-MOSFET Spice models for the purposes of studying the impact of parameter’s spread on series-connected devices. A SiC-MOSFET model available in literature is adapted. A set of 30 commercial SiC-MOSFETs is characterized. The extration tool is used to generate Spice model file for each device, which are validated by comparison to double puls...

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sic-mosfets

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