Radiation-Hardness-by-Design Latch-based Triple Modular Redundancy Flip-Flops

Oliver Schrape,Anselm Breitenreiter, Carsten Schulze,Steffen Zeidler,Miloš Krstić

2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS)（2021）

引用 5|浏览4

暂无评分

摘要

The paper presents an alternative Single-Event Effect (SEE)-tolerant Triple Modular Redundancy (TMR) circuit topology for space applications. The proposed D-flip-flop circuit scheme is fully digitally designed and consists of local Single Event Transient (SET) filter for transient mitigation on the datapath. A latch-based master-slave decomposition with the usage of commercially available unharden...

查看译文

关键词

Single event transients,Circuit topology,Microprocessors,Redundancy,Computer architecture,BiCMOS integrated circuits,Robustness

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要