OCVD Measurement of Ambipolar and Minority Carrier Lifetime in 4H-SiC Devices: Relevance of the Measurement Setup

The open-circuit voltage decay (OCVD) method is a well-known technique for conducting electrical measurements of carrier lifetime: the main advantages lie in the simple setup and the possibility of carrying out measurements in commercial devices without the need of removing the package, as for optical methods. Despite several researchers having reported carrier lifetimes measured by the OCVD metho...