Copper sintered Si 3 N 4 Power Modules in Thermal Shock Tests

2021 International Conference on Electronics Packaging (ICEP)(2021)

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摘要
The mechanical behavior of Al2O3-DCB and Si3N4-AMB power modules comprising copper sintered SiC-and Si-dice in liquid to liquid thermal shock cycles (LL-TSC) from −40°C to +200 °C is presented. SiC-MOSFET dice from two different vendors and Si-test chips were sintered with and without pressure under H2- and N2-atmosphere onto the substrate. Shear values of pressure-assisted samples sintered at 12 ...
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关键词
Scanning electron microscopy,Liquids,Microscopy,Thermal shock,Multichip modules,Failure analysis,Acoustics
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