SENSEI: Characterization of Single-Electron Events Using a Skipper Charge-Coupled Device

PHYSICAL REVIEW APPLIED(2022)

引用 19|浏览18
暂无评分
摘要
We use a science-grade skipper charge-coupled device (skipper CCD) operating in a low-radiation background environment to develop a semiempirical model that characterizes the origin of single electron events in CCDs. We identify, separate, and quantify three independent contributions to the single-electron events, which were previously bundled together and classified as "dark counts": dark current, amplifier light, and spurious charge. We measure a dark current, which depends on exposure, of (5.89 +/- 0.77) x 10(-4) e-/pix/day, and an unprecedentedly low spurious charge contribution of (1.52 +/- 0.07) x 10(-4) e-/pix, which is exposure independent. In addition, we provide a technique to study events produced by light emitted from the amplifier, which allows the detector's operation to be optimized to minimize this effect to a level below the dark-current contribution. Our accurate characterization of the single-electron events allows one to greatly extend the sensitivity of experiments searching for dark matter or coherent neutrino scattering. Moreover, an accurate understanding of the origin of single-electron events is critical to further progress in ongoing research and development efforts of skipper and conventional CCDs.
更多
查看译文
关键词
events,single-electron,skipper-ccd
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要