Characterizing Energetic Dependence of Low-Energy Neutron-Induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65-nm Bulk SRAM

Characterizing low-energy neutrons (<10 MeV)-induced single-event upsets (SEUs) and multiple cells upsets (MCUs) is essential to validate the current standard for terrestrial soft error rate (SER) and investigate its enhancement. Following our preliminary analysis on the contribution of the low-energy neutrons to the total terrestrial SER at the nominal operating voltage of 1.0 V by Liao et al. (2...