Single-Shot Temporal Characterization Of Ultrashort Xuv Pulses

X-RAY LASERS AND COHERENT X-RAY SOURCES: DEVELOPMENT AND APPLICATIONS XIII(2019)

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摘要
We report on the development and implementation of a diagnostic for the temporal characterization of ultrashort XUV pulses with a single-shot capability. The method which relies on laser-dressed photoionization in a home-made velocity map-imaging spectrometer was implemented on a HHG beamline based on a plasma mirror.
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关键词
ultrashort pulses, extreme-ultraviolet, high-order harmonics generation, photoelectron spectroscopy, temporal metrology
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