Impact of Drain Leakage Current on Short Circuit Behavior of GaN/SiC Cascode Devices
IEEE Transactions on Power Electronics(2021)
Abstract
The short circuit (SC) behavior of a newly developed GaN-HEMT/SiC-JFET cascode device is investigated in this work. The reverse leakage current through the drain-side PN junction (I
R
) of the SiC JFET under SC conditions is measured simultaneously during the SC event. I
R
of the SiC JFET increases to 6.4 A at the end of a 5-μs nondestructive SC pulse. The increase of I
R
during the SC pulse induces a turning point in the SC current waveform and a dramatic negative threshold voltage shift (>30 V) in the SiC JEFT, resulting in high transient drain-to-source voltage in the GaN HEMT. The underlying mechanism is associated with the increase of local potential in the P-type layer of the SiC JFET with inevitable spread resistance (R
SPD
). It is suggested that reducing R
SPD
can improve SC capability and high I
R
should be considered in SC failure mechanism analysis and the design of external gate resistance of the SiC JFET.
MoreTranslated text
Key words
Cascode device,gallium nitride (GaN) high-electron-mobility transistors (HEMT),short circuit (SC) current,silicon carbide (SiC) junction field-effect transistor (JFET),threshold voltage
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined