Special Session: Reliability Analysis for AI/ML Hardware
2021 IEEE 39th VLSI Test Symposium (VTS)(2021)
摘要
Artificial intelligence (AI) and Machine Learning (ML) are becoming pervasive in today’s applications, such as autonomous vehicles, healthcare, aerospace, cybersecurity, and many critical applications. Ensuring the reliability and robustness of the underlying AI/ML hardware becomes our paramount importance. In this paper, we explore and evaluate the reliability of different AI/ML hardware. The fir...
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关键词
Degradation,Performance evaluation,Neuromorphics,Random access memory,Hardware,Robustness,Reliability
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