The Electrical Bias Influence on the Total Ionizing Dose Degradation of the MOST Parameters
2021 International Siberian Conference on Control and Communications (SIBCON)（2021）
关键词
Radiation effects,total ionizing dose,power MOSFET
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要