Impact of Thermal Effects on the Performance of the Power Gating Circuits Using NEMS, FinFETs, and NWFETs
IEEE Transactions on Electron Devices(2021)
摘要
In this article, the power gating (PG) technique is analyzed using nano-electro-mechanical switches (NEMS), FinFETs, and nanowire field-effect transistors (NWFETs). We have used detailed circuit level simulations using well-calibrated models to obtain the conditions for net energy saving with thermal effects. We demonstrate that for a benchmark 17-stage buffer chain circuit, the NEMS PG will be su...
更多查看译文
关键词
FinFETs,Nanoelectromechanical systems,Integrated circuit modeling,Logic gates,Temperature,Temperature measurement,Semiconductor device modeling
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要