Impact of Thermal Effects on the Performance of the Power Gating Circuits Using NEMS, FinFETs, and NWFETs

IEEE Transactions on Electron Devices(2021)

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摘要
In this article, the power gating (PG) technique is analyzed using nano-electro-mechanical switches (NEMS), FinFETs, and nanowire field-effect transistors (NWFETs). We have used detailed circuit level simulations using well-calibrated models to obtain the conditions for net energy saving with thermal effects. We demonstrate that for a benchmark 17-stage buffer chain circuit, the NEMS PG will be su...
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关键词
FinFETs,Nanoelectromechanical systems,Integrated circuit modeling,Logic gates,Temperature,Temperature measurement,Semiconductor device modeling
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