Applications for Machine Learning in Semiconductor Manufacturing and Test (Invited Paper)
2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)(2021)
摘要
In this invited paper, applications for Machine Learning (ML) in several areas of semiconductor manufacturing and test are reviewed and potential opportunities are discussed.
更多查看译文
关键词
Machine learning algorithms,Machine learning,Manufacturing
AI 理解论文
溯源树
样例
![](https://originalfileserver.aminer.cn/sys/aminer/pubs/mrt_preview.jpeg)
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要