Bulk defects induced coercivity modulation of Co thin film based on a Ta/Bi double buffer layer

Journal of Magnetism and Magnetic Materials(2020)

Cited 3|Views20
No score
Abstract
•Significant regulation on coercivity of Co film is researched by defect engineering.•Based on a Ta/Bi double buffer layer, coercivity is tuned with the Bi diffusion.•Increment of bulk defect intensity in film enhances pinning strength on domain wall.•Magnetic anisotropy enhancement leads to the coercivity increment simultaneously.
More
Translated text
Key words
Cobalt thin film,Coercive field,Microstructures,Defect
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined