Search
ChatPaper
AI Writing
analysis
Analysis
编组
Open Data
more
More
RankingsMust ReadingJournal&ConferenceAI TRAI HistoryMaster Reading TreeXiaomai's Star TalentsTrajectoryTalentNDI TrackerOpenAI sign Language
VIPCreated with Sketch.

Systematic Analysis of Reliability of Large Area 4H-SiC Charged Particle Detector under Harsh He Ion Irradiation

Run-Long Gao,Lin-Yue Liu,Jin-lu Ruan,Peng Jin,Xiao Ouyang,Lei-Dang Zhou,Yang Li,Si-Long Zhang,Kuo Zhao,Xiao-Ping Ouyang

IEEE Transactions on Nuclear Science（2021）

Cited 8|Views8
No score
Abstract
Silicon carbide (SiC) detectors have great potential in nuclear fusion diagnosis and intense irradiation field measurement due to their outstanding irradiation resistance, high charge collection efficiency (CCE), and fast pulse response time. However, the irradiation resistance and the performance degradation of SiC detectors as a result of He ion irradiation remains unclear. In this article, SiC ...
More
Translated text
Key words
Detectors,Silicon carbide,Radiation effects,Ions,Energy resolution,Dark current,Degradation
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined