Rad-Hard Designs by Automated Latching-Delay Assignment and Time-Borrowable D-Flip-Flop

As the safety-critical applications (e.g., automotive and medical electronics) emerge, various techniques of radiation hardening by design (RHBD) are proposed to deal with soft errors. Among all RHBD techniques, Built-In Soft-Error Resilience (BISER) is the first one to apply the delayed latching to separate input signals on all flip-flops for error detection. However, the delay values induced by ...