LEEM imaging of the moiré pattern of twisted bilayer grapheneTobias de Jong,Tjerk Benschop, Xing Chen,Dmitri Efetov,Felix Baumberger,Rudolf Tromp,Michiel de Dood,Milan P. Allan,Sense Jan van der MolenBulletin of the American Physical Society(2021)引用 0|浏览7暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要