JEDEC-Qualified Highly Reliable 22nm FD-SOI Embedded MRAM for Low-Power Industrial-Grade, and Extended Performance Towards Automotive-Grade-1 Applications

V. B. Naik,K. Yamane,T. Y. Lee,J. Kwon,R. Chao,J. H. Lim,N. L. Chung,B. Behin-Aein,L. Y. Hau,D. Zeng,Y. Otani,C. Chiang,Y. Huang,L. Pu,S. H. Jang,W. P. Neo,H. Dixit, S. K. L. C. Goh,E. H. Toh,T. Ling,J. Hwang,J. W. Ting,R. Low,L. Zhang, C. G. Lee,N. Balasankaran,F. Tan,K. W. Gan,H. Yoon, G. Congedo,J. Mueller,B. Pfefferling,O. Kallensee,A. Vogel, V Kriegerstein,T. Merbeth,C. S. Seet,S. Ong, J. Xu,J. Wong,Y. S. You,S. T. Woo,T. H. Chan,E. Quek,S. Y. Siah

2020 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)（2020）

Cited 20|Views19

No score

Abstract

We demonstrate highly reliable and mass-production ready 22nm FD-SOI 40Mb embedded-MRAM for industrial-grade (-40~125°C) applications. This technology having 5x solder reflows compatibility stack has passed JEDEC standard qualification (ECC-OFF) with total reliability failures below the product life-time bit-failure-rate requirement for industrial-grade. Using design-process co-optimization, we show the extended performance to meet -40~150°C product operation for Auto-Grade-1 applications with stable read performance, ~47% reduced read power, data retention of 20yrs (0.1 PPM), read disturb rate of <1 PPM for ~1M cycles with 500Oe field, 1M endurance cycles, and stand-by magnetic immunity (SMI) of ~1400Oe at 25°C and ~500Oe at 150°C (0.1 PPM). With magnetic shield-in package solution, we demonstrate ~4kOe SMI at 25°C for 48hrs of field exposure.

Translated text

Key words

extended performance,automotive-grade-1 applications,mass-production,JEDEC standard qualification,reliability failures,product life-time bit-failure-rate requirement,design-process co-optimization,product operation,Auto-Grade-1 applications,stable read performance,endurance cycles,JEDEC-qualified highly reliable FD-SOI,embedded MRAM,solder reflows,stand-by magnetic immunity,low-power industrial-grade,size 22.0 nm,temperature -40.0 degC to 150.0 degC,Si

AI Read Science

Must-Reading Tree

Example

Generate MRT to find the research sequence of this paper

Chat Paper

Summary is being generated by the instructions you defined