76- to 81-GHz CMOS Built-In Self-Test With 72-dB C/N and Less Than 1 ppm Frequency Tolerance for Multi-Channel Radar Applications

IEEE Journal of Solid-State Circuits(2021)

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摘要
A built-in self-test (BIST) system with a 72-dB carrier-to-noise ratio (C/N) and less than 1-ppm frequency tolerance of down-converted BIST tone for a multi-channel radar application is presented. The BIST consists of a frequency doubler, an up-conversion mixer (UPMIX), a variable gain amplifier, a phase shifter, an eight-way splitter, and an RF PAD coupler for BIST signal distribution. The propos...
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关键词
Built-in self-test,Radar,Phase locked loops,Radio frequency,Gain,Radar applications,Monitoring
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