Direct Synthesis Of Zif-8 On Transmission Electron Microscopy Grids Allows Structure Analysis And 3d Reconstruction

The first example of layer-by-layer growth of a metal-organic framework (MOF) directly on transmission electron microscopy (TEM) grids is described. ZIF-8 is deposited on thin amorphous carbon films and subjected to a structure analysis by (scanning) TEM ((S)TEM). This method serves as a two-in-one synthesis and TEM sample-preparation technique and allows straightforward analysis of ZIF-8 crystallites. Artifacts resulting from sample preparation are completely avoided by this approach. The morphological properties, crystal structure, and the chemical composition of the material are investigated with high spatial resolution by a variety of methods of (analytical) electron microscopy. Furthermore, the incorporation of metallic nanoparticles in ZIF-8 by integrating a corresponding step into the layer-by-layer deposition process is examined. The formation of ZIF-8 crystals on the film proceeds as under the absence of nanoparticle-forming synthesis steps. However, the nanoparticles rather cover the supporting amorphous carbon film than being incorporated in the ZIF-8 material. This information cannot be obtained from standard characterization techniques but requires the application of analytical (S)TEM techniques.