A Gridless Method for Microwave Coincidence Imaging Based on Atomic Norm Minimization

Microwave coincidence imaging (MCI) has great potential in the staring and forward-looking imaging realms. However, the existing grid-based imaging methods usually suffer from grid mismatch problem which would significantly degrade the imaging performance. In this paper, a gridless MCI imaging method based on the atomic norm minimization (ANM) is proposed to offer a resolution to the grid mismatch problem, while maintaining the super-resolution ability of MCI.